Test Design Methodology for Time-Domain Immunity Investigations Using Electric Near-Field Probes

This article investigates the possibility to develop time-domain immunity tests using electric near-field probes, for flexible customization of broadband input waveforms injected into specific pins PCBs. For this purpose, a test design methodology is proposed, which based on circuit modeling injection mechanism one hand, and pulse equalization other hand. Two models are developed. The former employs measurement/simulation data along with port-reduction techniques model noise through probes by means internal induced sources. Conversely, latter only includes passive components derived starting from physical observation involved phenomena. Both compatible solvers can be easily adapted different traces under test. Since pulse-like usually broadband, suitable stress utilized obtain spectra. Also, in order precisely control shape waveform reaching targeted pin, an procedure employed. These applied amplification systems originally designed frequency-domain tests, thus providing comprehensive solution time domain. feasibility accuracy proposed proved full-wave simulations measurements.